AccessEngineering
AccessEngineering provides access to thousands of pages of McGraw-Hill content from such renowned resources as
Perry's Handbook for Chemical Engineers and
Marks' Standard Handbook for Mechanical Engineers. Also included: powerful search tools, interactive tables and graphs, instructive videos and student study guides, time-saving curriculum guides, and global engineering news.
ACerS-NIST Phase Equilibria Diagrams Online
This is an online source of 23,000 critically evaluated phase diagrams for oxides, salts, carbides, nitrides, borides, compound semiconductors, and chalcogenides. Functionality includes:
• Search commentaries and diagrams by chemical system, published author's last name, volume, language, publication year, and figure number.
• View diagram's chemical system, figure number, figure notes, references, commentary, and footnotes.
• Manipulate diagrams with zoom in/out, lever rule, curve follow, mirror, Mol% to Wt% or Wt% to Mol%, and built-in calculator.
Note: To get started, click on the link "Click Here Without Signing In to Access Phase Diagrams" on the home page.
ASM Alloy Center
The
ASM Alloy Center enables you to search in one easy step across ASM property data, performance charts, and processing guidelines for specific metals and alloys. Includes data sheets and diagrams, an alloy finder, materials property data, coatings data, and corrosion data.
ASM Failure Analysis Center
The
ASM Failure Analysis Center features over 1,000 case histories along with authoritative handbook information on failure mechanisms and analysis methods. Find specific information to help you quickly solve your own failure analysis or materials performance issues.
ASM Micrograph Center
The
ASM Micrograph Center is a comprehensive collection of micrograph images and associated data. The emphasis of the collection is on micrographs for industrially important alloys. Information captured for each image includes material designation and composition, processing history, service history, metallographic preparation/technique, magnification, significance of the structures shown, selected materials properties data, and other relevant data.
